TRB Pubsindex
Text Size:

Title:

OPAL: OPTIMIZATION PLATFORM FOR AIRPORTS INCLUDING LANDSIDE
Cover of OPAL: OPTIMIZATION PLATFORM FOR AIRPORTS INCLUDING LANDSIDE

Accession Number:

00929305

Record Type:

Component

Availability:

N/A
Find a library where document is available


Order URL: http://worldcat.org/issn/00978515

Abstract:

OPAL (Optimization Platform for Airports including Landside), through its simulation and evaluation capabilities, supports decision making by airport authorities, airlines, air traffic service providers, and governments. It provides this decision support in the form of a facility for distributed simulation into which several airport performance models can be integrated. The objective of this workshop presentation was twofold: 1) to introduce the concept of total airport analysis, and 2) to explain the architecture proposed for the integration of analytical and simulation models in simultaneously studying airside and landside operations.

Supplemental Notes:

Distribution, posting, or copying of this PDF is strictly prohibited without written permission of the Transportation Research Board of the National Academy of Sciences. Unless otherwise indicated, all materials in this PDF are copyrighted by the National Academy of Sciences. Copyright © National Academy of Sciences. All rights reserved

Language:

English

Corporate Authors:

Transportation Research Board

500 Fifth Street, NW
Washington, DC 20001 United States

Authors:

Zografos, K G

Editors:

Rakas, J
Mumayiz, S A

Pagination:

p. 6-10

Publication Date:

2002-8

Serial:

Transportation Research Circular

Publisher: Transportation Research Board
ISSN: 0097-8515

Conference:

Airport-Airspace Simulations: A New Outlook

Location: Washington, D.C.
Date: 2002-1-13 to 2002-1-13
Sponsors: Transportation Research Board

Features:

Figures (4)

Uncontrolled Terms:

Subject Areas:

Aviation; Highways; Planning and Forecasting; Terminals and Facilities

Files:

TRIS, TRB

Created Date:

Aug 28 2002 12:00AM

More Articles from this Serial Issue: