TRB Pubsindex
Text Size:

Title:

IDENTIFICATION OF PAVEMENT FAILURE MECHANISMS AT FHWA ACCELERATED LOADING FACILITY ULTRATHIN WHITETOPPING PROJECT

Accession Number:

00936212

Record Type:

Component

Availability:

Transportation Research Board Business Office

500 Fifth Street, NW
Washington, DC 20001 United States
Order URL: http://www.trb.org/Main/Public/Blurbs/152818.aspx

Find a library where document is available


Order URL: http://worldcat.org/isbn/0309077419

Abstract:

In 1998 eight test lanes of ultrathin whitetopping (UTW) were constructed over existing hot-mix asphalt (HMA) pavements at the Federal Highway Administration's Accelerated Loading Facility (ALF) located at the Turner-Fairbank Highway Research Center in McLean, Virginia. Various combinations of thicknesses, joint spacings, fiber reinforcement, and types of HMA base were used. In spring 2000 the loading experiment of these pavements was completed, and the analysis of behavior and performance was begun. A summary of some of the pavement distresses observed at the ALF is presented, and hypothesized failure mechanisms are identified, providing an addition to the state of the knowledge with respect to the actual life cycle of UTW pavements.

Supplemental Notes:

This paper appears in Transportation Research Record No. 1816, Pavement Management, Monitoring, and Accelerated Testing 2002.

Language:

English

Corporate Authors:

Transportation Research Board

500 Fifth Street, NW
Washington, DC 20001 United States

Authors:

Rasmussen, R O
McCullough, B F
Ruiz, J M
Mack, J Hunter
Sherwood, J A

Pagination:

p. 148-155

Publication Date:

2002

Serial:

Transportation Research Record

Issue Number: 1816
Publisher: Transportation Research Board
ISSN: 0361-1981

ISBN:

0309077419

Features:

Figures (11) ; Photos (5) ; References (1) ; Tables (2)

Subject Areas:

Design; Highways; Pavements; I22: Design of Pavements, Railways and Guideways; I23: Properties of Road Surfaces

Files:

TRIS, TRB, ATRI

Created Date:

Jan 28 2003 12:00AM

More Articles from this Serial Issue: