TRB Pubsindex
Text Size:

Title:

PAVEMENT EVALUATION USING ROAD METERS

Accession Number:

00044514

Record Type:

Monograph

Abstract:

Many instruments are available for measuring pavement roughness. Some of these instruments are costly and obtain very detailed data. Most require that pavement condition be measured at low speeds, thus demanding that production rates be quite low. For many years, engineers have been searching for a device that gives the required information but is inexpensive to produce and operate. The road meter, first developed by Max P. Brokaw, is a simple device that essentially measures the relative movement of the rear axle of a passenger car with respect to the frame of the car. This device permits obtaining a large amount of data and can in fact be operated by 1 person in a passenger car, although generally 2 individuals are required. Because the instrument is new, a need has existed to bring together engineers and researchers who are using the device to discuss the experience of various agencies in obtaining pavement condition data by this technique.

Supplemental Notes:

This report consists of the proceedings of a workshop held April 18-20, 1972 at Purdue University. Distribution, posting, or copying of this PDF is strictly prohibited without written permission of the Transportation Research Board of the National Academy of Sciences. Unless otherwise indicated, all materials in this PDF are copyrighted by the National Academy of Sciences. Copyright © National Academy of Sciences. All rights reserved

Corporate Authors:

Transportation Research Board

500 Fifth Street, NW
Washington, DC 20001 United States

Pagination:

128 p.

Publication Date:

1973

Serial:

Highway Research Board Special Report

Issue Number: 133
Publisher: Highway Research Board

Conference:

Workshop on Pavement Evaluation Using Road Meters

Location: West Lafayette Indiana, United States
Date: 1972-4-18 to 1972-4-20

Media Type:

Print

Subject Areas:

Highways; Pavements

Files:

TRIS, TRB, ATRI

Created Date:

Jun 15 2001 12:00AM

More Articles from this Serial Issue: