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Title: Simplified Viscoelastic Continuum Damage Model as Platform for Asphalt Concrete Fatigue Analysis
Accession Number: 01468543
Record Type: Component
Record URL: Availability: Transportation Research Board Business Office 500 Fifth Street, NW Find a library where document is available Abstract: Cracking in asphalt concrete pavements is a major form of pavement distress in the United States. Because the cracking phenomenon is complex and cracking is often affected by both material and structural factors, field engineers have no quick and effective test and analysis protocols. A suite of fatigue analysis tools—as well as applications built around the simplified viscoelastic continuum damage (S-VECD) model—is presented. The S-VECD formulation is presented in a summarized form. Next, the characterization protocols, which are consistent with the capabilities of the asphalt mixture performance tester, are shown. Considerable attention is then given to S-VECD–based analysis tools for assessment of material- and pavement-level fatigue performance. Results show that the S-VECD model can be used to predict the number of cycles until fatigue failure for both constant stress and constant strain loading. The S-VECD model’s sensitivity to mixture composition and external factors is shown through predictions of the endurance limit. Finally, pavement performance predictions are used to show how the S-VECD model can predict the field performance results of full-scale accelerated pavement tests, quantify the expected performance of pavement design alternatives, and identify factors that affect top-down cracking.
Monograph Title: Monograph Accession #: 01457891
Report/Paper Numbers: 12-1383
Language: English
Authors: Underwood, B ShaneBaek, CheolminKim, Y RichardPagination: pp 36-45
Publication Date: 2012
ISBN: 9780309262965
Media Type: Print
Features: Figures; References
Uncontrolled Terms: Subject Areas: Highways; Materials; Pavements; I31: Bituminous Binders and Materials
Files: TRIS, TRB, ATRI
Created Date: Jan 4 2013 8:33AM
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