|
Title: DESIGNING AN IMPROVED INTERNATIONAL PASSENGER PROCESSING FACILITY: A COMPUTER SIMULATION ANALYSIS APPROACH
Accession Number: 00602698
Record Type: Component
Availability: Find a library where document is available Abstract: During the past 20 years, the management engineering and analysis group of the Port Authority of New York and New Jersey has periodically performed design and operational evaluations of the international passenger processing system facilities at the John F. Kennedy International Airport. The most recent effort included the development and validation of a computer simulation model of the Federal Immigration and Naturalization and Customs Services and the baggage processing operations. This model was developed to perform operational analyses of planned improvements to the federal inspection facilities. The simulation was initially used to evaluate the expected operational performance of two alternative baggage system expansion plans. The model development, initial model application, and results are described in this paper.
Supplemental Notes: This paper appears in Transportation Research Record No. 1273, Airport Terminal and Landside Design and Operation 1990. Distribution, posting, or copying of this PDF is strictly prohibited without written permission of the Transportation Research Board of the National Academy of Sciences. Unless otherwise indicated, all materials in this PDF are copyrighted by the National Academy of Sciences. Copyright © National Academy of Sciences. All rights reserved
Monograph Title: Monograph Accession #: 01495455
Authors: Gulewicz, VictorBrowne, JimPagination: p. 21-29
Publication Date: 1990
Serial: ISBN: 0309050200
Features: Figures
(22)
; Tables
(2)
TRT Terms: Uncontrolled Terms: Old TRIS Terms: Subject Areas: Administration and Management; Aviation; Design; Finance; Highways; Operations and Traffic Management; Planning and Forecasting; Security and Emergencies; Society; Terminals and Facilities
Files: TRIS, TRB
Created Date: Dec 31 1990 12:00AM
More Articles from this Serial Issue:
|